Available instruments

X-ray group has a wide variety of x-ray instrumentation for measurements of polycrystalline materials (in different forms - bulk, powder, thin films) and also single crystals and epitaxial layers.

The instruments can operate with various x-ray wavelengths (Co, Cu, Mo and Ag), and in different geometries: Bragg-Brentano geometry, medium resolution parallel beam setting, high resolution geometry, with monochromatic Kα1 radiation and in coplanar and non-coplanar (in-plane) mode. Various sample environments, low and high temperature chambers, deformation (tensile and compression) stage, reaction chamber are available for individual diffractometers.

Methodologically, we can perform different kind of analysis - qualitative and quantitative phase analysis, structure refinement, the real structure of material studies: preferred orientation of crystallites – texture measurements, residual stress measurements, determination of crystallite size and microstrain (also dislocation density). We can measure reciprocal space maps, pair distribution function – total scattering, small angle x-ray scattering and grazing-incidence small angle x-ray scattering.

In addition to X-ray instruments we have also Zeta nanosizer for dynamic light scattering (DLS) - measurements of particle sizes and their distribution and measurement of zeta potential.

Complete list of instruments is at page of the laboratory and on web pages of MGML